팝업레이어 알림

PHI Quantes System에 대한 정보가 업데이트 되었습니다.


 - PHI Quantes Brochure

 - Additional transition available from Cr x-ray source

 - Announcing PHI's new in situ Dual Gas Cluster Ion Beam GCIB and
   monatomic ion source for Quantes XPS instruments

 - IMEC - Use of Lab-based HAXPES to Eliminate the Effect of Ion Beam
   Damage at Interfaces in Depth Profiles

 - PHI Quantes with Dual Souce Ion gun

 - Analysis of buried interface in multilayer device structures with hard
   XPS HAXPES using a CrKa souce

 

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New LEIPS & REELS for PHI 5000 VersaProbe III


- LEIPS (Low Energy Inverse Photoemission Spectroscopy)
- REELS (Reflection Electron Enrgy Loss Spectroscopy
- Energy Diagram Evaulation of All Solid State Ba
- LEIPS Flyer
- Low Energy Inverse Photoelectron Spectroscopy LEIPS
- VersaProbe III LEIPS

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