PHI Quantes System에 대한 정보가 업데이트 되었습니다.
- PHI Quantes Brochure
- Additional transition available from Cr x-ray source
- Announcing PHI's new in situ Dual Gas Cluster Ion Beam GCIB and
monatomic ion source for Quantes XPS instruments
- IMEC - Use of Lab-based HAXPES to Eliminate the Effect of Ion Beam
Damage at Interfaces in Depth Profiles
- PHI Quantes with Dual Souce Ion gun
- Analysis of buried interface in multilayer device structures with hard
XPS HAXPES using a CrKa souce
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