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| X-ray Photoelectron
Spectroscopy / XPS |
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| PHI X-tool |
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| This high performance scanning XPS instrument
comes with a low price yet makes measurements for
all types of applications and features easy, intuitive
operation. |
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| Auger Electron Spectroscopy
/ AES, SAM |
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| PHI
710 |
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The only scanning Auger nanoprobe in the world
that guarantees a field emission electron source
whose spatial resolution is 8 nm or less.
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| Time-of-Flight SIMS
/ TOF-SIMS |
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| PHI nanoTOF II™ |
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| This new TOF-SIMS instrument has the added flexibility
needed to support diversified analysis application
and also provides automated measurement from sample
loading through to measurement. |
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| Learn
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| Dynamic SIMS / D-SIMS |
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| Other Systems |
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